Searching...
Nothing found.
[[ item.description.prodDescription ]]
This Product is on your Inquiry List.
7KP2200-8BM
Manufacturer: SIEMENS
Price: On Request
KTX-XY CONTROL ATTACHMENT FOR TEXTURE EXAMINATIONS WITH OPEN EULERIAN CRADLE, FOR RETROFITTING OF DACO-MP CONTROL UNIT
Similar items in same category:
7KP2200-8BH | RAM EXPANSION TO 440 KBYTE OF DACO-MP CONTROL UNIT, RETROFITTING KIT FOR DACO-MP WITHOUT MEASURING ELECTRONICS | |
7KP2200-8BJ | RAM EXPANSION TO 440 KBYTE OF DACO-MP CONTROL UNIT, RETROFITTING KIT FOR DACO-MP WITH MEASURING ELECTRONICS | |
7KP2200-8BK | KME-PLUS ATTACHMENT FOR RETROFITTING OF DACO-MP CONTROL UNIT, WITH MEASURING ELECTRONICS | |
7KP2200-8BL | TX-XY CONTROL UNIT FOR TEXTURE EXAMINATIONS WITH OPEN EULERIAN CRADLE | |
7KP2200-8CA | OPEN EULERIAN CRADLE FOR DETERMINATION OF INTERNAL STRESS AND PREFERRED ORIENTATIONS BY MEANS OF D5000 AND D500 DIFFRACTOMETERS X-TRANSLATION STEP MOTOR CONTROLLED | |
7KP2200-8CB | OFFENE EULERWIEGE ZUR BESTIMMG. V. EIGENSPANNUNGEN UND TEXTUREN M.DIFFRAKTOMETERN D5000 X- U. Y-TRANSLATION SCHRITTMOTORGESTEUERT | |
7KP2200-8CC | 1/4-CIRCLE EULERIAN CRADLE FOR MINATION OF POLE FIGURES AND RE STRESSES OR HIGH RESOLUTION DIF TOMETRIE WITH THE D5000 SYSTEM, PER MOTORS (CHI, PHI,X,Y,Z), AB ANGULAR RANGE IN CHI 100 G, IN AND X- AND Y-TRANSLATION +/- 75 | |
7KP2200-8CD | SAMPLE HOLDER 1/4 CIRCLE EULERI CRADDLE |